Introduction to Scanning Electron Microscopy
Thursday, 26 April 2012 at 09:30 - Friday, 27 April 2012 at 16:00 (BST)
Uxbridge, United Kingdom
The one day Brunel University course, "Introduction to Scanning Electron Microscopy" gives delegates theoretical and practical overview of scanning electron microscopy (SEM); including imaging techniques, high resolution SEM, and energy dispersive X-ray analysis, which provides compositional information. Held at the Experimental Techniques Centre (ETCbrunel), course attendees will investigate the theory and practice of both standard SEM, and the Centre’s advanced field emission scanning electron microscope (FEG-SEM), which combines ultra-high resolution with variable pressure mode allowing optimum imaging of a range of sample types.
A combination of lectures and demonstrations will explore the theory, practice and application of these powerful analytical tools. With its highly practical approach, running from sample preparation through image collection and compositional analysis, this course is designed to give delegates a good working overview of SEM use and capabilities.
An additional day is also available on 27th April (immediately following the course) with 1-to-1 and small group work on the microscopes, enabling practical hands-on experience including with your own samples.
Because of its emphasis on practical skills, the number of delegates will be limited to 12 per course so early booking is recommended. Delegates are encouraged to bring their own samples so that we can offer expert advice on their preparation and examination.
Course notes and certificate of attendance will be provided. More details can be found on our website: http://www.etcbrunel.co.uk/courses_files/training.htm or email email@example.com
When & Where
Dr Benjamin Jones
ETCbrunel has been established for over thirty years in consultancy and research utilising high powered microscopes and analytical methods to investigate a wide range of materials. Our events build on our long experience and are designed for industrialists and academic researchers who want to learn more of the operation, capabilities and application of these powerful analysis techniques.
Contact: Dr Benjamin J Jones firstname.lastname@example.org