Topic: XPS and ToFSIMS analysis of corrosion and related problems
Prof. Ian W. Fletcher CSci CChem FRSC
Professor of Surface Engineering, School of Mechanical and Systems Engineering, Newcastle University
Absract: This talk will present a brief outline of the analytical techniques along with a few example applications where surface chemical analysis using X-ray Photoelectron Spectroscopy (‘XPS’) and Time-of-Flight Secondary Ion Mass Spectrometry (‘ToFSIMS’) has helped with industrial corrosion issues. Examples will be presented of corrosion inhibitor developments, failures of protective coatings and unexpected corrosion in a new plant design.
18:15 -18:30 Attendees arrive - refreshments
19:50 Discussion and close