Royce XRD Data Analysis Workshop
Training workshop to cover diffraction and scattering data analysis for powder and thin film samples, with the programs TOPAS, AMASS, Gudrun
Location
Department of Physics - The Cavendish Laboratory
JJ Thomson Avenue Cambridge CB3 0US United KingdomAgenda
10:00 AM - 12:30 PM
Monday 24 Nov AM -Introduction to powder diffraction and Rietveld refinement
2:00 PM - 5:00 PM
Monday 24 Nov PM - Sequential Rietveld refinement
9:30 AM - 12:30 PM
Tuesday 25 Nov AM - Crystallite size and microstrain
2:00 PM - 5:00 PM
Tuesday 25 Nov PM - Amorphous fraction quantification
9:30 AM - 5:00 PM
Wednesday 26 Nov AM & PM - X-ray characterization of thin films
9:30 AM - 12:30 PM
Thursday 27 Nov AM - Neutron diffraction
2:00 PM - 5:00 PM
Thursday 27 Nov PM - Structural refinement of small molecule compounds
9:30 AM - 12:30 PM
Friday 28 Nov AM - PDF data treatment
2:00 PM - 5:00 PM
Friday 28 Nov PM - PDF modelling
Good to know
Highlights
- 8 hours
- In person
About this event
A one-week, technically-focused workshop from 24th - 28 November 2025 at the Maxwell centre, University of Cambridge, providing hands-on training in X-ray Diffraction.
Please complete an application form after checkout. Places are limited (40) with paid for sessions on Tuesday 25 to Friday 28 November (Day 2 - 5), and a free introductory session on Monday 24 November (Day 1). In regard to the free introductory session, priority will be given to those attending the paid for sessions on day 2 -5. Additional spaces on this free day, will be given on a first come, first serve basis. Your place will be confirmed only after the payment of the fee. An e-sale form will be sent to you after registration.
XRD provides information on the crystallographic phases in solid materials. However, analysis of XRD data can be complex, often requiring detailed knowledge of the physical processes taking place to correctly interpret findings. The event aims to assist instrument users in understanding how to best approach their own data through shared examples and investigation.
If you plan to use X-ray diffraction to support your research but do not have background knowledge in Materials Science, this workshop is for you. Through intense practical exercises, you will learn how to analyse X-ray diffractograms with confidence.
This comprehensive training will cover:
- The basics of analysing X-ray Diffraction patterns
- Moving to more advanced topics and the meanders of Rietveld refinements.
Through the demonstration of basic analysis principles, working with training datasets, and user-submitted examples, the content will help users of the university’s XRD facilities develop understanding of best practice approaches to exploring their own data. Training workshop to cover diffraction and scattering data analysis for powder and thin film samples, with the programs TOPAS, AMASS and Gudrun.
The workshop is aimed at MPhil, PhD students and PDRA who are making use of the XRD facilities on campus to generate data in support of their research, as well as industry employees.
Fees:
Monday 24 November (Day 1) - FREE.
Tuesday 25 - Friday 28 November (Day 2 - 5) - £50/day academic; £125/day industry.
Weekly ticket: £150 academic; £400 industry.
Please send any questions to royce@maxwell.cam.ac.uk
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