X-ray computed tomography and beyond

X-ray computed tomography and beyond

X-ray computed tomography and beyond: Next-generation tools for non-destructive testing and dimensional evaluation

By National Physical Laboratory

Date and time

Location

NPL North, 3M Buckley Innovation Centre

Firth Street Huddersfield HD1 3BD United Kingdom

About this event

  • Event lasts 2 hours

Industrial x-ray computed tomography (XCT) is being positioned as a next-generation tool for non-destructive testing and dimensional evaluation.


Delivering insights where traditional inspection methods fall short, XCT supports the manufacturing of increasingly sophisticated products with functional internal geometries, miniaturised features and complex multi-material constructions. Beyond inspection, XCT is employed in process development, optimisation and the validation of alternative inline measurement techniques. Driven by both market pull and technology push, XCT is an increasingly relevant tool across multiple manufacturing sectors.


Our next Manufacture Measurement Network workshop will explore XCT technology, bringing together leading scientists from the National Physical Laboratory, National Facility for X-ray Computed Tomography (NXCT) and the Science and Technology Facilities Council’s Central Laser Facility (STFC). We will provide insight into how information is captured using XCT in contrast to other measurement techniques, introduce a contemporary metrology challenge in the application of deep learning image enhancement to an XCT-derived dimensional measurement and highlight the cutting-edge metrology making XCT traceable and reducing barriers to its use.


We will also consider how the Central Laser Facility’s soon-to-be-commissioned Extreme Photonics Application Centre (EPAC) will be used to see inside objects a traditional XCT system cannot, XCT’s limitations.


Agenda:
16:00 | Registration

16:10 | Opening address - Eleanor Merson, National Physical Laboratory (NPL)

16:15 | Introduction to XCT – David Gorman (NPL)

16:25 | XCT case study with Baker Hughes – David Gorman (NPL)

16:40 | Introduction to the NXCT – Nicola Wadeson (NXCT)

16:55 | XCT metrology for additive manufacturing - Darragh Broadbent (NPL/ University of Huddersfield)

17:10 | The Extreme Photonics Application Centre, a new facility for next generation XCT - Claire Pizzey (STFC)

17:25 | Panel session and Q+A with NPL, NXCT & STFC

17:45 | Closing remarks – David Gorman (NPL)

17:50 | Networking


The meeting will be held in person at NPL North.


For all NPL events we aim to accommodate specific needs and personal circumstances, but are reliant on individuals sharing this information with us. If you have any specific requirements or adjustments to support your attendance, please do let us know by emailing events@npl.co.uk, so that we can discuss how we can best support you. Any information shared will be confidential and deleted after the event.

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FreeJul 8 · 16:00 GMT+1