Faraday Tech: FIB-SEM Techniques for 3D-SEM and TEM-Prep

The Henry Royce Institute is the UK’s national institute for advanced materials research and innovation. With its Hub at The University of Manchester, the Royce is a partnership of nine leading institutions – the universities of Cambridge, Imperial College London, Liverpool, Leeds, Oxford, Sheffield, the National Nuclear Laboratory, and UKAEA. The Institute’s aims are to undertake world-class research in materials science, to accelerate the commercialisation of materials research for economic and societal benefit and to train the next generation of materials scientists and engineers to tackle some of our most pressing global challenges.

Henry Royce Institute

Faraday Tech Series (Talk 1 of 3): FIB-SEM Techniques for 3D-SEM and TEM-Prep

Correlative microscopy has the potential to transform the way in which battery research is conducted. Using correlative techniques, we can observe battery processes across a range of length-scales in an interconnected and targeted manner. In these talks, we discuss a range of ion/laser milling techniques which assist correlative investigations by bridging the micro- and nano-scale information typically provided by tomography and TEM. The talks aim to provide a more in-depth account of the techniques introduced in the 10th March Faraday Masterclass lecture given by Prof. Philip Withers and Dr. Matthew Curd. Although designed as a series, delegates are welcome to attend any/all of the talks which interest them.In this talk (#1 of 3) we will discuss "dual beam" focussed ion beam (FIB) and scanning electron microscope (SEMs) instruments. FIB-SEMs are high precision cutting tools which can be used for cross-sectional imaging, 3D serial sectioning tomography and the fabrication of micro/nanoscale samples for TEM (and others). We will discuss these operations, material/geometric sample requirements and damage quantification with a focus on battery materials. We will discuss both traditional Ga source FIBs and high current Xe plasma FIBs, which can perform high speed, low damage milling on a range of materials.In talk 2 we will cover Broad Ion Beam (BIB) and fs-laser techniques (<a href="https://www.eventbrite.co.uk/e/large-volume-3d-sem-broad-ion-beam-and-fs-laser-techniques-tickets-144718080675">booking link here</a>);In talk 3 we will discuss the post-acquisition processing and reconstruction of 3D-SST data (<a href="https://www.eventbrite.co.uk/e/reconstruction-of-3d-sem-data-tickets-144719093705">booking link here</a>). Please note:This seminar series is a joint Faraday Institution and Henry Royce Institute training course: registration data will be shared with both of the organising bodies.This seminar series is open to UK-based academics only. We reserve the right to refuse access to the seminars if this condition is not met.

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Faraday Tech: FIB-SEM Techniques for 3D-SEM and TEM-Prep

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Faraday Tech: FIB-SEM Techniques for 3D-SEM and TEM-Prep

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